1. Fault-tolerance and reliability techniques for high-density random-access memories
Author: Chakraborty, Kanad
Library: Library of Institute for Research in Fundamental Sciences (Tehran)
Subject: Reliability ، Random access memory,، Integrated circuits -- Fault tolerance,، Semiconductor storage devices
Classification :
TK
7895
.
M4C44
2. Fault-tolerance and reliability techniques for high-density random-access memories
Author: / Kanad Chakraborty , Pinaki Mazumder
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Random access memory -- Reliability,Integrated circuits -- Fault tolerance,Semiconductor storage devices
Classification :
TK
7895
.
M4C44
2002
3. Fault-tolerance and reliability techniques for high-density random-access memories
Author: / Kanad Chakraborty, Pinaki Mazumder
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Random access memory -- Reliability,Integrated circuits -- Fault tolerance,Semiconductor storage devices
Classification :
TK
7895
.
M4C44
